graph_description.test.cpp File Reference

#include "barretenberg/boomerang_value_detection/graph.hpp"
#include "barretenberg/circuit_checker/circuit_checker.hpp"
#include "barretenberg/crypto/aes128/aes128.hpp"
#include "barretenberg/crypto/generators/generator_data.hpp"
#include "barretenberg/crypto/pedersen_commitment/pedersen.hpp"
#include "barretenberg/stdlib/encryption/aes128/aes128.hpp"
#include "barretenberg/stdlib_circuit_builders/mock_circuits.hpp"
#include "barretenberg/stdlib_circuit_builders/plookup_tables/fixed_base/fixed_base.hpp"
#include "barretenberg/stdlib_circuit_builders/ultra_circuit_builder.hpp"
#include <gtest/gtest.h>

Go to the source code of this file.

Functions
	TEST (boomerang_ultra_circuit_constructor, test_graph_for_arithmetic_gates)
	Test graph description of circuit with arithmetic gates.
	TEST (boomerang_ultra_circuit_constructor, test_graph_for_arithmetic_gates_with_shifts)
	Test graph description of Ultra Circuit Builder with arithmetic gates with shifts.
	TEST (boomerang_ultra_circuit_constructor, test_graph_for_boolean_gates)
	Test graph description of circuit with boolean gates.
	TEST (boomerang_ultra_circuit_constructor, test_graph_for_elliptic_add_gate)
	Test graph description for circuit with one elliptic addition gate.
	TEST (boomerang_ultra_circuit_constructor, test_graph_for_elliptic_double_gate)
	Test graph description for circuit with one elliptic double gate.
	TEST (boomerang_ultra_circuit_constructor, test_graph_for_elliptic_together)
	Test graph description for circuit with elliptic addition and multiplication gates.
	TEST (boomerang_ultra_circuit_constructor, test_graph_for_sort_constraints)
	Test graph description for circuit with 2 sort constraints.
	TEST (boomerang_ultra_circuit_constructor, test_graph_for_sort_constraints_with_edges)
	Test graph description for circuit with 2 sorted constraints with edges.
	TEST (boomerang_ultra_circuit_constructor, test_graph_with_plookup_accumulators)
	Test graph description for circuit with gates created from plookup accumulators.
	TEST (boomerang_ultra_circuit_constructor, test_variables_gates_counts_for_arithmetic_gate)
	Test variable gate counts for variables from arithmetic gates without shifts.
	TEST (boomerang_ultra_circuit_constructor, test_variables_gates_counts_for_arithmetic_gate_with_shifts)
	Test variable gate counts for variables in circuit with gates with shifts.
	TEST (boomerang_ultra_circuit_constructor, test_variables_gates_counts_for_boolean_gates)
	Test variable gate counts for variables in circuit with boolean gates.
	TEST (boomerang_ultra_circuit_constructor, test_variables_gates_counts_for_sorted_constraints)
	Test variable gate counts in circuit with sorted constraints.
	TEST (boomerang_ultra_circuit_constructor, test_variables_gates_counts_for_sorted_constraints_with_edges)
	Test variable gate counts for variables in circuit with sorted constraints with edges.
	TEST (boomerang_ultra_circuit_constructor, test_variables_gates_counts_for_ecc_add_gates)
	Test variable gate counts for variables in circuit with elliptic addition gates.
	TEST (boomerang_ultra_circuit_constructor, test_variables_gates_counts_for_ecc_dbl_gate)
	Test variable gate counts for variables in circuit with elliptic double gates.
	TEST (boomerang_ultra_circuit_constructor, test_graph_for_range_constraints)
	Test graph description of circuit with range constraints.
	TEST (boomerang_ultra_circuit_constructor, composed_range_constraint)
	Test graph description of circuit with decompose function.

Function Documentation

TEST() [1/18]

TEST	(	boomerang_ultra_circuit_constructor	,
		composed_range_constraint
	)

Test graph description of circuit with decompose function.

This test verifies that:

• All variables must be in one connected component

Definition at line 657 of file graph_description.test.cpp.

TEST() [2/18]

TEST	(	boomerang_ultra_circuit_constructor	,
		test_graph_for_arithmetic_gates
	)

Test graph description of circuit with arithmetic gates.

This test verifies that:

• The number of connected components equals the number of pairs (i,j), where 0<=i,j<16
• Each pair creates an isolated component, resulting in 256 total components

Definition at line 23 of file graph_description.test.cpp.

TEST() [3/18]

TEST	(	boomerang_ultra_circuit_constructor	,
		test_graph_for_arithmetic_gates_with_shifts
	)

Test graph description of Ultra Circuit Builder with arithmetic gates with shifts.

This test verifies that:

• When all gates have shifts, they form a single connected component
• The shift operation connects all variables in the circuit

Definition at line 55 of file graph_description.test.cpp.

TEST() [4/18]

TEST	(	boomerang_ultra_circuit_constructor	,
		test_graph_for_boolean_gates
	)

Test graph description of circuit with boolean gates.

This test verifies that:

• All variables are isolated with boolean gates
• The number of connected components is 0
• All variables are in one gate

Definition at line 88 of file graph_description.test.cpp.

TEST() [5/18]

TEST	(	boomerang_ultra_circuit_constructor	,
		test_graph_for_elliptic_add_gate
	)

Test graph description for circuit with one elliptic addition gate.

This test verifies that:

• The circuit forms one connected component containing 6 variables
• The variables represent the coordinates of three points: (x1,y1), (x2,y2), (x3,y3)
• Where (x3,y3) is the result of adding (x1,y1) and (x2,y2)

Definition at line 115 of file graph_description.test.cpp.

TEST() [6/18]

TEST	(	boomerang_ultra_circuit_constructor	,
		test_graph_for_elliptic_double_gate
	)

Test graph description for circuit with one elliptic double gate.

This test verifies that:

• The circuit forms one connected component containing 4 variables
• The variables represent the coordinates of two points: (x1,y1) and (x3,y3)
• Where (x3,y3) is the result of doubling (x1,y1)

Definition at line 150 of file graph_description.test.cpp.

TEST() [7/18]

TEST	(	boomerang_ultra_circuit_constructor	,
		test_graph_for_elliptic_together
	)

Test graph description for circuit with elliptic addition and multiplication gates.

This test verifies that:

• The circuit forms 2 connected components
• First component contains: x1, y1, x2, y2, x3, y3, x4, y4
• Second component contains: x5, y5, x6, y6, x7, y7, x8, y8
• Each component represents a separate elliptic curve operation sequence

Definition at line 182 of file graph_description.test.cpp.

TEST() [8/18]

TEST	(	boomerang_ultra_circuit_constructor	,
		test_graph_for_range_constraints
	)

Test graph description of circuit with range constraints.

This test verifies that:

• All variables must be in one connected component

Definition at line 629 of file graph_description.test.cpp.

TEST() [9/18]

TEST	(	boomerang_ultra_circuit_constructor	,
		test_graph_for_sort_constraints
	)

Test graph description for circuit with 2 sort constraints.

This test verifies that:

• The circuit forms 2 connected components
• First component contains: a_idx, b_idx, c_idx, d_idx
• Second component contains: e_idx, f_idx, g_idx, h_idx
• Each sort constraint creates its own connected component

Definition at line 239 of file graph_description.test.cpp.

TEST() [10/18]

TEST	(	boomerang_ultra_circuit_constructor	,
		test_graph_for_sort_constraints_with_edges
	)

Test graph description for circuit with 2 sorted constraints with edges.

This test verifies that:

• The circuit forms 2 connected components
• First component contains: a_idx through h_idx
• Second component contains: a1_idx through h1_idx
• Each sort constraint with edges creates its own connected component

Definition at line 279 of file graph_description.test.cpp.

TEST() [11/18]

TEST	(	boomerang_ultra_circuit_constructor	,
		test_graph_with_plookup_accumulators
	)

Test graph description for circuit with gates created from plookup accumulators.

This test verifies that:

• The circuit forms one connected component
• Plookup accumulator gates connect all variables in the circuit

Definition at line 336 of file graph_description.test.cpp.

TEST() [12/18]

TEST	(	boomerang_ultra_circuit_constructor	,
		test_variables_gates_counts_for_arithmetic_gate
	)

Test variable gate counts for variables from arithmetic gates without shifts.

This test verifies that:

• Each variable (except index 0) appears in exactly one gate
• Variables with index 0 appear in no gates

Definition at line 367 of file graph_description.test.cpp.

TEST() [13/18]

TEST	(	boomerang_ultra_circuit_constructor	,
		test_variables_gates_counts_for_arithmetic_gate_with_shifts
	)

Test variable gate counts for variables in circuit with gates with shifts.

This test verifies that:

• Variables with index == 0 mod 4 and index != 4 have gate count == 2
• All other variables (except index 0) have gate count == 1
• Variables with index 0 have gate count == 0

Definition at line 403 of file graph_description.test.cpp.

TEST() [14/18]

TEST	(	boomerang_ultra_circuit_constructor	,
		test_variables_gates_counts_for_boolean_gates
	)

Test variable gate counts for variables in circuit with boolean gates.

This test verifies that:

• All variables (except index 0) have gate count == 1
• Variables with index 0 have gate count == 0

Definition at line 442 of file graph_description.test.cpp.

TEST() [15/18]

TEST	(	boomerang_ultra_circuit_constructor	,
		test_variables_gates_counts_for_ecc_add_gates
	)

Test variable gate counts for variables in circuit with elliptic addition gates.

This test verifies that:

• All variables in the connected component have gate count == 1
• The component contains the 6 variables representing the coordinates of the points

Definition at line 553 of file graph_description.test.cpp.

TEST() [16/18]

TEST	(	boomerang_ultra_circuit_constructor	,
		test_variables_gates_counts_for_ecc_dbl_gate
	)

Test variable gate counts for variables in circuit with elliptic double gates.

This test verifies that:

• All variables in the connected component have gate count == 1
• The component contains the 4 variables representing the coordinates of the point

Definition at line 593 of file graph_description.test.cpp.

TEST() [17/18]

TEST	(	boomerang_ultra_circuit_constructor	,
		test_variables_gates_counts_for_sorted_constraints
	)

Test variable gate counts in circuit with sorted constraints.

This test verifies that:

• All variables in both connected components have gate count == 1
• Each sort constraint creates a separate component with consistent gate counts

Definition at line 468 of file graph_description.test.cpp.

TEST() [18/18]

TEST	(	boomerang_ultra_circuit_constructor	,
		test_variables_gates_counts_for_sorted_constraints_with_edges
	)

Test variable gate counts for variables in circuit with sorted constraints with edges.

This test verifies that:

• All variables in both connected components have gate count == 1
• Each sort constraint with edges creates a separate component with consistent gate counts

Definition at line 514 of file graph_description.test.cpp.